ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,089, issued on May 12, was assigned to QUANTUM IP LLC (Stuart, Fla.). "RF-based special material detection system with secure multi-dimensio... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,090, issued on May 12, was assigned to Carl Zeiss SMT GmbH (Oberkochen, Germany) and Carl Zeiss X-ray Microscopy Inc. (Dublin, Calif.). "Ima... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,091, issued on May 12, was assigned to Rapiscan Holdings Inc. (Torrance, Calif.). "Systems and methods for automatically generating syntheti... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,092, issued on May 12, was assigned to Siemens Shanghai Medical Equipment Ltd. (Shanghai). "Correction method for scatter signal caused by w... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,093, issued on May 12, was assigned to NUCTECH COMPANY Ltd. (Beijing) and Tsinghua University (Beijing). "Radiographic inspection apparatus ... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,094, issued on May 12, was assigned to Nuctech Co. Ltd. (Beijing) and Tsinghua University (Beijing). "Inspection system and inspection metho... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,095, issued on May 12, was assigned to Viken Detection Corp. (Burlington, Mass.). "X-ray scanner with blanking" was invented by James P. Rya... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,096, issued on May 12, was assigned to Rolls-Royce Corp. (Indianapolis). "Measurement and determination of crystallographic texture with res... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,097, issued on May 12, was assigned to JOEL Ltd. (Tokyo) and TOHOKU UNIVERSITY (Sendai, Japan). "X-ray spectrum analysis apparatus and metho... और पढ़ें
ALEXANDRIA, Va., May 12 -- United States Patent no. 12,625,098, issued on May 12, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Non-destructive classification of specimens based o... और पढ़ें